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Advanced STEM Detectors


Advanced STEM Detectors

HAADF, ADF and BF/DF  detectors for EELS

Maximise electron collection with specially optimised detectors, to gain greater insights into your sample’s chemical and compositional properties.

  • Optimised detectors for precise collection of electrons:
    • Forward scattered electrons—EELS signal (0 to β), collection angle β regulated by STEM camera length
    • Medium-angle electrons—Advanced BF/DF STEM detector (~β to 2x β)
    • High-angle electrons—HAADF detector (~2x β to 7x β)
  • Absolute intensity measurements with detector offset and system gain calibration
  • Low noise electronics and scintillator/photomultiplier tube (PMT) based design
    • Detect single electrons at low fluxes
    • Record high signal-to-noise ratio images at typical fluxes
  • Optimise contrast in real time with automated PMT gain selection
  • Remote operation with software controlled detector gain and insertion
  • One-click switching from dark field to bright field STEM mode (model 807)
  • Integrates with Gatan EELS systems
  • Upgrade your existing STEM system: Compatible with Gatan cameras and DigiScan II

Gatan advanced STEM detectors work with EELS systems to collect the whole angular range of scattered electrons seamlessly. For EELS mapping and STEM (Scanning Transmission Electron Microscopy) imaging, it’s vital to control the detector angle for collecting and interpreting data effectively.

Contact us for more information and quotes:
+44 (0)1223 422 269 or info@blue-scientific.com

Advanced STEM Detectors

Detector geometry is important in combined EELS and STEM imaging. The EELS experiment dictates the camera length; STEM detectors must be the correct size and position for optimal image interpretation.


  • EELS (Electron Energy Loss Spectroscopy)
  • HAADF (High-Angle Annular Dark Field)
  • ADF (Annular Dark Field)
  • BF/DF (Bright and Dark Field)


  • Optimised angles for EELS
  • Calibrated output
  • Low noise and broad range
  • Compatible with Gatan cameras


HAADF and ADF images acquired simultaneously using Gatan STEM detectors. The Z-contrast effect of the HAADF enables the contast to be interpreted easily. The diffraction contrast of the ADF is highly detailed. Together they present a more complete overview of the sample.



a) HAADF image of a GaAs/GaAsP multilayer laminate; b) Integrated diffraction pattern of the super-lattice structure along the [011] zone axis; c) Virtual BF image extracted from a 4D data cube, quantifying strain down to 1.2 nm resolution in full 2D area in eyy; d) exx strain. Courtesy of V. B. Ozdol et al., National Center for Electron Microscopy, Lawrence Berkeley National Laboratory and Department of Materials Science and Engineering, University of California.