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Ilion II


Ilion II

Prepare surfaces for SEM cross sections

The Gatan Ilion II is a broad beam argon milling system. Produce cross sections and planar polish samples for SEM (Scanning Electron Microscopy), EBSD, cathodoluminescence and analytical techniques where the signal is generated near the surface.

  • Low energy milling to reduce surface damage
  • Digital zoom microscope¬† for monitoring polishing in real time
  • Review and analyse images from the microscope
  • Easy touchscreen control

Variety of Materials

Suitable for polishing a wide range of materials, including samples consisting of multiple elements and alloys with a range of mechanical hardness, size and physical characteristics.

Temperature-Sensitive Samples

With Gatan’s WhisperLok technology, you can load and unload without venting the chamber. An optional temperature controlled liquid nitrogen cooling stage is available to protect temperature-sensitive samples.

Contact us for more information and quotes:
+44 (0)1223 422 269 or info@blue-scientific.com

Gatan Ilion II Polishing System



  • EBSD sample preparation
  • Semiconductors
  • Metals (oxides, alloys
  • Ceramics
  • Geological samples
  • Oil shales
  • Polymers


  • Ideal for techniques where the signal is generated near the surface
  • Damage free surfaces
  • Observe polishing in real-time
  • Repeatable results, with easy-to-use recipes


EBSD Sample Prep

EBSD at 20 kV of tungsten carbide / cobalt sample with no phase transformation of the cobalt phase from FCC to HCP. Polished at 1 kV with the Ilion II. Courtesy of Dr. A Gholinia, University of Manchester.


Gatan Ilion Polished Example

Backscattered electron image of a 2.5 interposer structure, prepared using the Ilion II. Courtesy of the Fraunhofer Institute, Dresden, Germany. © 2013 Fraunhofer IZM, Dept. HDI&WLP/ASSID.


Polymer cross-section

Polymer aerogel cross section prepared with the Gatan Ilion II. Courtesy of the Leventis Lab, Missouri University of Science & Technology, USA.