Join Bruker for a webinar about bulk quantification with micro-XRF on Thursday, 1st June 2017.
Approaches to Bulk Quantification
In XRF, there are various methods for quantifying spectra from bulk samples, each with its own benefits and drawbacks. The Bruker M4 TORNADO’s “tool box” of quantification methods equips you with various options for quantification of non-ideal sample types.
For unknown samples, the fundamental parameter (FP) approach enables quantification of virtually any sample spectra from homogeneous bulk materials with reasonable precision. However, it does not usually consider tertiary and higher-order effects in the sample. The quality of an FP quantification depends on your existing knowledge of the FP parameters of each element and the potential inter-element effects for certain combinations of elements. These parameters are more well-known for some elements than for others.
In addition, not all samples are suitable for bulk FP quantification. The FP quantification based on Sherman’s equation assumes the sample to be ideal. Quantification can also be challenging if the sample contains significant amounts of elements lighter than Sodium, e.g., Water, CO2, etc.
To improve precision, it is therefore recommended to either combine FP quantification approaches with standards (semi-empirical standard-supported FP) or to use fully empirical methods such as Lucas-Tooth or polynomial calibration (correlating counts with particular sample properties, e.g., thickness or element concentration) for samples with negligible inter-element effects.
At the end of the webinar, there will be a 15-minute Q&A session.
Who is the webinar for?
- Quality control specialists verifying the composition of metal samples
- Failure analysis in industry and material research laboratories
- R&D researchers
Speakers
- Dr Roald Tagle – Senior Micro-XRF Application Scientist, Bruker Nano Analytics
- Dr Max Buegler -Micro-XRF Application Scientist, Bruker Nano Analytics
- Falk Reinhardt – Micro-XRF Application Scientist, Bruker Nano Analytics
Registration
There will be two sessions, both with the same content:
- Session I:
8 am GMT, 10 am CEST, 4 pm CST, 5 pm JST - Session II:
8 am PDT, 11 am EDT, 3 pm GMT, 5 pm CEST
