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Observing dynamic processes with in-situ TEM

Observe Dynamic Processes with In-Situ TEM: Atomic-Scale Crystal Nucleation and Growth Dynamics

Capture dynamic processes during in-situ TEM experiments with the Gatan OneView IS camera, at up to 25 fps with 16 MP images. In this example, researchers at the University of Tokyo observed crystal nucleation and growth at atomic scale.

MMC 2021

MMC 2021

Register now for MMC 2021 (online) microscopy conference. Visit our virtual booth at the exhibition!

Mining

Trace Analysis of Geological Materials with XRF

Precise, accurate trace analysis of geological materials including rocks, minerals & soils with the Bruker S8 TIGER Series 2 WD_XRF & GEO-QUANT Traces, a dedicated solution package.

Analyse Contaminants in Battery Materials with SEM-EDS

Analyse Contaminants in Battery Materials with Combined SEM / EDS

Combined SEM-EDS can be used to locate and identify contamination quickly and easily. The Thermo Scientific Axia ChemiSEM fully integrates the two techniques.

Metal Analysis

Working Towards Climate-Neutral Steel Production with OES Metals Analysis

As the steel industry works to reduce its carbon footprint, working towards climate neutral production, elemental analysis is required to maintain and monitor product quality. OES (Optical Emission Spectrometry) is a useful metals anlaysis technique to monitor concentrations of vital elements at all stages of production and recycling, as processors work to reduce emissions without compromising quality or steel grades.

In-Situ EM Video Tutorials

In-Situ EM Data Processing Tutorial Videos (Gatan Microscopy Suite: GMS 3)

A series of video tutorials demonstrating how to use Gatan’s IS player, part of GMS 3 (Gatan Microscopy Suite) software for TEM/SEM.

Identifying defects in polymers

Characterising Glass Fibre-Reinforced Polymers and Composite Materials with SEM-EDS

SEM-EDS can be used to characterise the composition of polymer composites. This is useful in failure analysis, to detect and identify contaminants and defects, and to check homogeneity.

UWBG Semiconductor Defects

Analysing Ultra-Wide Bandgap (UWBG) Semiconductors with Cathodoluminescence (CL)

Map defect distribution and variations for process development of materials for electronic / optoelectronic devices. CL is ideal for materials not suitable for photoluminescence spectroscopy.

Bruker EIGER2 R 250K XRD Detector

New EIGER2 R 250K XRD Detector for Bruker XRD

The EIGER2 R 250K is an HPC (Hybrid Photon Counting) pixel detector for the Bruker D8 ADVANCE and DISCOVER XRD systems.

Metals Failure Analysis

Failure Analysis of Metals with SEM / EDS

How SEM/EDS is used in failure analysis of steel, with examples of bend test failures, coating defects and corrosion in the automotive industry.

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