Between different configurations and geometries.
The Bruker D8 DISCOVER is an easy-to-use X-ray diffraction system for all materials research analytical techniques, including:
Switch easily between tasks, with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities.
Between different configurations and geometries.
Faster analysis and more data.
Size is the most important feature of a 2D detector. A large detector window speeds up data collection and enables you to access information not possible with 0D, 1D or smaller 2D detectors. Bruker’s VÅNTEC-500 detector has a large 140mm diameter window, covering up to approximately 80° (2θ) and a large γ-range.
The D8 DISCOVER is compatible with Bruker’s EIGER2 R series of HPC (Hybrid Photon Counting) X-ray detectors:
Factory-aligned SNAP-LOCK X-ray optics enable true ‘plug-and-play’ functionality. Switch diffraction geometries automatically, with no need for tools and minimal user intervention.
X-ray optics modules, detectors and accessories are automatically and instantly recognised when mounted on the instrument. Relevant parameters and loaded and analytical capabilities are recognised. In addition, the software detects and alerts you of any possible component conflicts.
Instruments for measuring thin films and coatings.
Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
Analytical techniques for process control of manufacturing involving metal powders. How XRD, XRF and micro-CT are used for failure analysis, element composition and mapping, crystalline phase identification, parts inspection and more.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and film reflections and accurate peak intensities. Blue Scientific is the official distributor for Bruker XRD in Norway, Sweden, Denmark, Finland and Iceland. For more information […]
