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Renishaw InVia InSpect
Renishaw Raman

The Renishaw InVia InSpect is a version of Renishaw’s established InVia confocal Raman microscope, optimised specifically for trace analysis in forensic labs.

Identify materials that would be difficult or time consuming using other techniques, such as hard crystalline powders, ceramic shards and glass chips.

Benefits

Highly specific

Identify materials that would be time-consuming with other techniques and differentiate chemical structures

Little or no sample preparation

Non-destructive

Ideal for multiple analyses

Complementary

To other microscopic techniques

Details

  • See fine detail – High spatial resolution, comparable to other microscopic techniques. Pinpoint the Raman analysis using a range of optical microscopy techniques.
  • Discriminate between the target and surrounding material using Renishaw’s EasyConfocal technology for high spatial resolution and contrast.
  • Little or no sample preparation – Raman spectra can be acquired from any sample you could focus on with an optical microscope.
  • Highly specific identification – Differentiate chemical structures, even if they’re closely related.
  • Non-contact and non-destructive – Analyse evidence multiple times without any damage.

Raman is complementary to other microscopic techniques including SEM, FLM, microspectrophotometry, FT-IR, polarised light microscopy and glass refractive index measurements. Results can be combined easily with SEM, AFM, fluorescence, FT-IR and optical microscopy using Renishaw’s Correlate software module, to reveal chemical composition.

Features

  • High spatial resolution – Comparable to other microscopic techniques.
  • Range of microscope contrast techniques including:
    • Brightfield
    • Darkfield
    • Polarisation contrast with reflected and transmitted light illumination
    • …and more
  • Locate points/areas of interest on complex substrates with a high-performance video camera and long working distance objectives.
  • High-precision motorised stage – Essential for analysing microscopic particles.
  • Dual laser wavelengths – Easily switch between wavelengths using the software, to analyse the same point on the sample.
  • Automated alignment – With built-in calibration checking.
  • Particle analysis – Advanced image recognition algorithms and instrument control features for characterising particle distribution.
  • Correlative imaging – Build composite images that combine Raman data with other microscopy images.

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