Identify materials that would be time-consuming with other techniques and differentiate chemical structures

The Renishaw InVia InSpect is a version of Renishaw’s established InVia confocal Raman microscope, optimised specifically for trace analysis in forensic labs.
Identify materials that would be difficult or time consuming using other techniques, such as hard crystalline powders, ceramic shards and glass chips.
Identify materials that would be time-consuming with other techniques and differentiate chemical structures
Ideal for multiple analyses
To other microscopic techniques
Raman is complementary to other microscopic techniques including SEM, FLM, microspectrophotometry, FT-IR, polarised light microscopy and glass refractive index measurements. Results can be combined easily with SEM, AFM, fluorescence, FT-IR and optical microscopy using Renishaw’s Correlate software module, to reveal chemical composition.