Perform all types of Raman measurements:

• Time series – How your sample alters over time
• Temperature ramps – Phase changes with a hot/cold cell
• Line scans – Profile your sample across the surface or into its depth
• Area mapping – Horizontal images at fixed focus across the topography, or vertical slices. More details…
• Volume scans – 3D views of your transparent sample’s internal structure
• Transmission mapping – Analyse large volumes of material and produce depth-averaged 2D images of bulk material homogeneity
• Specialist measurements – Trigger data collection from your own equipment (eg control system on a synchrotron beamline)
• Identify components in mixtures – With the new Spectrum Search software module.
• Automated particle analysis – With a dedicated software module.

Models

The range includes three models, from the entry level inVia Basis to the flagship inVia Qontor. Contact us for details.

Wide Range of Samples

Analyse a whole range of samples easily:

• Highly sensitive – Study weak Raman scatterers, thin films and tiny particles
• Sampling options – For small and large samples
• Optional polarisation kits – For crystalline samples. Orientate or scramble polarisations of both the laser and analyser.

High Quality Results

• SynchroScan™ technology ‑ gets you the entire spectrum at high resolution, without artefacts.
• High spectral resolution ­‑ easily identify materials (even chemically similar polymorphs) and monitor material stress
• Stable ‑ your results are repeatable and reliable
• Background correction ‑ automatically remove fluorescent backgrounds

Simplicity and Speed

Collect data quickly and automatically:

• Highly efficient system
• Line focus option – reduces laser power density, to prevent damage. Keep your signal levels up and acquire data rapidly.
• Data analysis options ‑ extract the information you need from your spectra
• Adjustable spatial resolution ‑ switch from sub-micro-metre high-resolution measurements to large scale averaging of bulk samples
• Store and re-use your measurement configurations

Raman Images

Raman images reveal spatial information about materials and their properties. Create images to show the spatial relationship of sample variation:

• Different materials, forms and compositions
• Distribution and size of chemical species
• Relative amounts within mixtures
• Stress and strain
• Crystal quality

Images can be taken across the sample’s surface, or as vertical slices or 3-dimensional images, displaying chemical information in new ways.

Imaging Techniques

• Large area mapping – more details…
• Fast, high resolution mapping
• Surveying for known materials
• Sloping and uneven surfaces

Combine with Other Microscopy Techniques

Overlay Raman images with results from other microscopy systems including SEM, AFM, infrared, fluorescence and optical microscopy. Renishaw’s Correlate software module makes it easy to combine your data for powerful insights. More info…

Volume Analysis

Determine detailed chemical and property information from volumes. Suitable for samples transparent to lasers and Raman signals.

• Presence and size of biological features eg nucleus and organelles within cells
• Inclusion size and shape within gemstones, glass and other transparent solids
• Variation in layer thickness of films egpolymer laminates and multi-layer coatings
• Distribution and size of droplets in emulsions
• Structure of foams and other delicate materials that cannot be touched
• Complex stress fields within transparent solids eg diamond

Overcome Refraction Issues

Refraction at interfaces can compromise the quality of volume images. The inVia has immersion objectives and cover-slip corrected objectives to reduce refraction, maintain confocality, and improve performance when looking deep into samples.

The software also corrects refractive index differences. The depth scale can be altered to reflect the true depth, rather than apparent depth.