Bruker CRONO
Micro-XRF & TXRF
Non-contact micro-XRF Scanning Spectrometer.
The Bruker CRONO is a mobile micro-XRF analyser for large artworks. Ideal for galleries and museums, perform fast, in-situ analysis of paintings and cultural heritage artefacts.
Benefits
600x450mm² Large area scanning
CRONO can be programmed to scan a large area
42mm/s Travel speed
Fast scanning of multiple elements simultaneously
0.5mm Smallest collimator option
Resolves fine structure details
Detachable head
For mobile use – weighs only 3kg
Details
The Bruker CRONO is easy to operate and reveals the crucial secrets of the object at which it is aimed. The optimal focus distance of 5 – 7 mm from the sample allows for non-contact measurement and is non-invasive and completely non-destructive. No sample preparation is required. Almost flat areas as large as 600 mm by 450 mm can be scanned.
The motorized frame can be setup with or without the support trolley in any orientation or easily be dismantled for transportation. The Bruker CRONO can be turned into a portable spot XRF spectrometer by installing the measurement head on a light tripod. Therefore the Bruker CRONO is ideal for on-site measurements.
High resolution optical images are recorded with an internal camera for each data point in addition to the XRF data. The Bruker CRONO can be equipped to with a He purging system to extend the range of detectable elements as far as Mg (Z = 12) to U (Z = 92). The Bruker CRONO micro-XRF spectrometer is equipped with several X-ray filters to optimize the excitation conditions for specific applications.
A spectrum or a map can be recorded with the CRONO software. The automatic peak ID provides a quick visual indication of elements in a sample. The interface shows the spectrum and the element concentration while the acquisition is running. Data interpretation is easy with the overlay of the optical images and the XRF data.
The powerful data processing software ESPRIT Reveal offers many options for the offline analysis. No instrument connection is required for post-processing.
- flexible, mobile system
- non-contact measurement
- non-invasive and non-destructive
- no sample preparation required
- easy measurement point monitoring
- detects a large range of elements: Mg (Z = 12) to U (Z = 92)
- overlay of elemental distribution and optical images
Get in Touch
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