Bruker ELIO

Portable Micro-XRF Spectrometer with Mapping Option The Bruker ELIO is easy to operate and reveals the crucial secrets of the object you aim at. High value objects are safe with the Bruker ELIO. The non-contact measurement is non-invasive and completely non-destructive. No sample preparation is required.

The light weight of the measurement head and the tripod make this system the only truly portable X-ray fluorescence (pXRF) spectrometer with mapping capabilities on the market and the perfect travel companion.

The alignment lasers identify the measurement point easily and ensure the correct and safe distance between sample and measurement head. High resolution optical images are recorded with an internal camera for each data point in addition to the XRF data.

The Bruker ELIO offers superior spectral quality with extremely low background which allows reliable qualitative trace element detection. The instrument can also be equipped with a He purging system to further extend the range of detectable elements as far as Na (Z = 11) to U (Z = 92). The Bruker ELIO micro-XRF spectrometer detects trace elements reliably thanks to the superior design of the electronics. The spectrometer can be equipped with several X-ray filters to optimize the excitation conditions for specific applications.

A spectrum or a map can be recorded with the ELIO software. The automatic peak ID provides a quick visual indication of elements in a sample. The interface shows the spectrum and the element concentration while the acquisition is running. Data interpretation is easy with the overlay of the optical images and the XRF data.

The powerful data processing software ESPRIT Reveal offers many options for the offline analysis.

• Truly portable and flexible
• non-contact measurement
• non-invasive and non-destructive
• no sample preparation required
• laser guidance and microscope camera for precise measurement position control
• overlay of elemental distribution and optical images
• reliable trace element detection