Bruker Dektak Pro™

Building on 55 years of surface measurement innovation and technology leadership, Dektak Pro™ sets a new standard for stylus profilometer performance. The system uniquely delivers the highest quality data with unrivaled ease of use.

This 11th-generation Dekta Pro™  system combines:

• Unmatched accuracy and better than 4 Å repeatability
• Accelerated measurement and analysis speed
• A suite of Bruker-exclusive versatility and ease-of-use features

Only Dektak Pro™ provides the latest stylus profilometry advances and reliability needed to support your cutting-edge research and industrial applications well into the future.

Over the last five decades, Bruker’s Dektak systems have led the industry in stylus profiling technology, achieving milestone improvements in resolution, stability, speed, and versatility. Now, Dektak systems are well-established as the gold standard of stylus profilers; when an accurate, trustworthy stylus profiler is needed, Dektak has long been the unquestioned solution.

Dektak Pro™ takes the next step forward in stylus profiling innovation, providing even more enhanced operability, reliability, and measurement accuracy to enhance and extend the qualities that make Dektak synonymous with stylus profiling.

Dektak Pro™ delivers accurate, precise data with the highest resolution, lowest noise floor, and easiest tip exchange of any commercially available stylus profilometer. State-of-the art measurement and analysis technology maximizes repeatability and accuracy, making single-nanometer step height measurements and better than 4 Å repeatability possible.

Every step of the measurement and analysis process is accelerated with Dektak Pro™. Direct-drive scan stage technology reduces time between scans, and 64-bit parallel processing in the Vision64^® software enables fast data processing.

Additional speed and ease-of-use technological advancements in Dektak Pro™:

• A new algorithm brings nearly the entire field of view into focus in the optical live image, making it easier to locate features of interest.
• New step height algorithms automate analysis routines, improve consistency, and minimize potential user error in step height calculations.