Bruker Innova

The compact Innova^® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of open-loop operation. The integrated, high-resolution color optics, open stage, and software experiment selector make setting up each new experiment fast and easy. With its highly customizable feature set, Innova offers the utmost value for high-resolution imaging and a wide range of functionality in physical, life, and material sciences research.

All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

With software-controlled optical zoom, Innova optics provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.

Innova provides excellent sample access, even when the microscope head is in place, without compromising the rigidity of the mechanical design. The physically open architecture offers greater flexibility for custom experiments, for example, by allowing the easy insertion of electrodes for electrical and electrochemical sample characterization.