Bruker Nano IR3-s
Nano Surfaces
Adds s-SNOM nanoscale electrical and optical characterization
Bruker’s nanoIR3-s system combines s-SNOM and AFM-IR with an integrated AFM.

Benefits
Rich IR spectra
Powerfuul, full featured AFM
Multifunctional measurements
Fast time to results
Spectra acquired in seconds
Details
Bruker’s Anasys nanoIR3-s system combines scattering scanning near-field optical microscopy (s-SNOM) and nanoscale IR spectroscopy (AFM-IR) with an integrated atomic force microscope (AFM), all in a single platform. Building upon the legacy of Anasys technology leadership in AFM-based nano-optical characterization, nanoIR3-s provides nanoscale IR spectroscopy, chemical imaging, and optical property mapping with 10-nanometer spatial resolution demonstrated on 2D material samples.
The system also enables AFM topographic imaging and material property mapping with nanometer-scale resolution, making it an ideal instrument for correlative studies across a wide range of material science applications. The nanoIR3-s with broadband option adds the latest OPO/DFG femtosecond laser technology to provide the broadest available spectral range (670 to 4000 cm⁻¹) with high-resolution nanochemical and nano-optical imaging capabilities.
NanoIR3-s provides:
- High-performance nano FTIR spectroscopy;
- High-performance IR SNOM spectroscopy with the most advanced nanoIR laser source available;
- nano FTIR spectroscopy with integrated DFG, continuum based laser source Broadband synchrotron light source integration; and
- Multi-chip QCL laser source for spectroscopy and chemical imaging.
Nano IR3-s Gallery
Nano IR3-s Photos
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