Bruker NanoTracker 2

The NanoTracker 2 is an optical tweezers platform based on research-grade inverted optical microscopes and designed for sensitive manipulation, force and tracking experiments. With the NanoTracker 2, the user can trap and track particles from several µm down to 30nm with the ability to control, manipulate and observe samples in real time with nanometer precision and femtoNewton resolution.

With the NanoTracker 2, the user can trap and track particles from several µm down to 30nm with the ability to control, manipulate and observe samples in real time with nanometer precision and femtoNewton resolution.

NanoTracker technology provides precisely quantifiable and reproducible measurements of particle/cell interactions. The system delivers precise information about single molecule mechanics and may also be used to determine mechanical characteristics such as adhesion, elasticity or stiffness on single molecules.

The new system is designed to detect the smallest forces and manipulate particles or molecules with the highest precision. Special laser stabilization and newly designed detection electronics in the head provide to very low noise levels. Additionally, the compact folded design of the laser beam path makes the system immune to drift.

Double-beam or multi-beam configurations, combined solutions for coarse and extra precise sample positioning give the user flexibility. Several beam steering options including the newly designed pivot-point piezo-driven mirrors and fast acousto-optic deflectors (AODs) perfectly match requirements of any application.

In addition to extensive sample positioning control including a customized closed-loop piezo sample stage option, the traps can be steered individually in 3D through the sample. Moreover, the laser power can be controlled for both traps independently. This freedom is required to allow a wide range of experimental assays and geometries.

The two traps are available full time and are generated from a single laser source by polarization splitting. This makes the system ultra-stable against drift.

The new back focal plane interferometry detection unit of the NanoTracker 2 is equipped with individual detectors for each trap having separate diodes to lateral (XY) and axial (Z) displacements of the trapped bead.

Such a detection approach, in combination with software-controlled dimming filters, allows the use of the full dynamic range of the detectors, achieving the highest possible sensitivity for any selected bead types, laser intensities and trap split ratios.