Bruker OT-AFM Combi-System
Nano Surfaces
Powerful optical tweezers and AFM combination.
AFM: Surface force measurement and high resolution imaging
Optical tweezers: 3D positioning, detection and manipulation
Benefits
Details
The OT-AFM Combi-System pairs the exceptional surface force measurement and imaging capabilities of AFM with the ability of optical tweezers to apply and measure smallest forces in 3D.
The OT-AFM Combi-System pairs the exceptional surface force measurement and imaging capabilities of AFM with the ability of optical tweezers to apply and measure smallest forces in 3D. The combined setup fulfills the highest demands on mechanical stability, flexibility, and modularity. A specially designed OT-AFM ConnectorStage is the key to combining any AFM of the NanoWizard or CellHesion family with the NanoTracker optical tweezers on a research-grade inverted optical microscope.
The unique combination of 3D positioning, detection, and manipulation provided by OT and the high-resolution imaging and surface property characterization of AFM opens up a whole new spectrum of applications, such as cellular response, cell-cell or cell matrix interactions, immune response, infection or bacterial/virus/nanoparticle uptake processes, and more.
With a multitude of available handles, interaction, and detection sites, OT-AFM significantly extends the range of single-molecule applications.
- Imaging, positioning, and manipulation experiments from single molecules to living cells
- Measure forces in 2D and 3D, from 500fN to 10nN, on the same sample
- Fully flexible and modular design, with the widest range of modes & accessories
- Comprehensive integration with optical microscopy techniques such as TIRF or confocal
- All NanoTracker, NanoWizard /CellHesion 200 systems can be combined to become a complete OT-AFM-platform
- The ConnectorStage combines the AFM with the tweezers hardware on all major inverted optical microscopes from Zeiss, Nikon, Olympus, and Leica
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