Bruker TS 75 TriboScope

The Hysitron TS 75 TriboScope delivers quantitative, rigid-probe nanoindentation and nanotribological characterization capabilities to Bruker’s world-leading atomic force microscopes. The Hysitron TriboScope interfaces with Bruker’s Dimension Icon, Dimension Edge, and MultiMode 8 AFMs to expand the characterization capabilities of these microscopes. By utilizing a rigid test probe, the TriboScope removes the intrinsic limitations, variability, and complexity associated with cantilever-based measurements to deliver quantitative and repeatable mechanical and tribological characterization over nanometer-to-micrometer length scales.

Most AFMs utilize a compliant cantilever to conduct mechanical or tribological testing, posing significant challenges in separating a cantilever’s flexural and rotational stiffness from the material’s response to applied stress. The TriboScope utilizes a rigid test probe assembly, allowing direct control and measurement of applied force and displacement during the test.

The TriboScope utilizes proprietary electrostatic force actuation and capacitive displacement sensing transducer technology to deliver industry-leading noise floors and low thermal drift for characterizing properties to the bottom of the nanoscale.

The TriboScope operates under closed-loop force control or displacement control. Utilizing a 78 kHz feedback loop rate, the TriboScope can respond to fast material deformation transient events and faithfully reproduce the test function defined by the operator.