Cameca LEAP® 5000
APT (Atom Probe Tomography)
3D Atom Probe Microscope with unmatched 3D sub-nanometer analytical performance.
The LEAP® 5000 is CAMECA’s cutting-edge atom probe microscope, offering superior detection efficiency across a wide variety of metals, semiconductors and insulators.
Benefits
Details
The LEAP® 5000 is CAMECA’s cutting-edge atom probe microscope, offering superior detection efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected per nm3 analyzed.
The LEAP® 5000 collects nanoscale information from a microscale dataset in just a few hours and delivers improved compositional accuracy, precision and detection limits, enhanced sample throughput together with increased yield and ultimate reproducibility.
- Optimized detection efficiency provides unparalleled sensitivity
- Large Field-of-View and detection uniformity – the ultimate 3D spatial resolution
- Excellent multi-hit detection capabilities for the most accurate compositional measurements
- Fast and variable repetition rate for ultra-high speed data acquisition
- Robust & ergonomic platform for increased ease-of-use and reduced time-to-knowledge
- Live-time monitoring to ensure the highest quality data in every measurement
- Advanced laser control algorithms provide measurably improved sample yields
LEAP® 5000 Gallery
LEAP® 5000 Photos
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