ThermoFisher Hypulse XPS

The Thermo Scientific Hypulse system combines traditional ion beams with femtosecond laser ablation (fs-LA) to enhance XPS depth profiling. This technology provides faster and more accurate analysis of thin films and deep interfaces, helping researchers optimise material properties, develop new coatings, and identify the root causes of material failure.

Unlock New Depths of Material Analysis
The Hypulse System uses Fs-LA XPS to provide rapid, high-precision analysis of complex materials without damaging their chemical structure.

Revolutionising XPS Depth Profiling
The Hypulse System overcomes the limitations of traditional ion-gun methods, providing the precise chemical analysis essential for high-tech industries like semiconductors and polymer engineering by ensuring data remains accurate and representative of the sample.

Integrated fs-laser Ablation System
The system is built around a fully integrated 1,030 nm fs-laser system and high-quality optical components.

Correlative XPS Imaging & Surface Analysis Workflow
Correlate XPS data with SEM images through the correlative imaging and surface analysis (CISA) workflow using Thermo Scientific Maps Software.