ThermoFisher K-Alpha XPS

The Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) System brings a new approach to surface analysis. Focused on delivering high-quality results using a streamlined workflow, the K-Alpha XPS System makes XPS operation simple and intuitive, with no sacrifice in terms of performance or capabilities.

State-of-the-art performance, reduced cost of ownership, increased ease of use, and high sample throughput make the K-Alpha XPS System ideal for a multi-user environment. The K-Alpha XPS System gives more researchers around the world access to surface analysis.

High-performance X-ray source:
The X-ray monochromator allows selection of analysis area from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.

Optimized electron optics:
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing:
Bring sample features into focus with the K-Alpha XPS System’s patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.

Insulator analysis:
The patented dual-beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.

Depth profiling:
Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Digital Control:
Intuitive operation—guided by the Avantage data system—makes the K-Alpha XPS System ideal for both multi-user, shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.

Optional sample holders:
Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.