ThermoFisher Nexsa G2 XPS

The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems.

The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.

High-performance X-ray source:
A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.

Optimized electron optics:
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing:
Bring sample features into focus with the Nexsa XPS System’s patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image.

Depth profiling:
Go beyond the surface with a standard ion source or MAGCIS, the optional dual-mode monatomic and gas cluster ion source; automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Optional sample holders:
Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.

Digital Control:
Instrument control, data processing, and reporting are all controlled from the Windows Software-based Avantage data system.

NX sample heater module:
Fully software-controlled sample heating option, enabling temperature-dependent studies.