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Posts Tagged ‘bruker d8 advance’

Bruker EIGER2 R 250K XRD Detector

New EIGER2 R 250K XRD Detector for Bruker XRD

The EIGER2 R 250K is an HPC (Hybrid Photon Counting) pixel detector for the Bruker D8 ADVANCE and DISCOVER XRD systems.

Bruker D8 DISCOVER Plus

Analysing Thin Films and Coatings with X-Ray Reflectometry

Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.

Microanalysis in Geology

Micro-Diffraction vs Standard Powder XRD in Geology

With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.