Analysing Thin Films and Coatings with X-Ray Reflectometry
Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
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multilayer materials
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Characterising Multilayer Films with IR Spectroscopy at Sub-micron Resolution
How to characterise multilayer films at sub-micron resolution with infrared, using O-PTIR spectroscopy.
