The Swedish Museum of Natural History used SIMS to determine that rock samples from India were formed around 1,850 million years ago. Previously it was thought that dating this type of sample wasn’t possible!
Self-focusing SIMS is a new technique for measuring the composition of semiconductors and SiGE devices. It’s ten times faster than studying nanometre-scale features directly with methods such as TEM or APT.
An overview of SIMS (Secondary Ion Mass Spectrometry) surface microanalysis, and how dynamic SIMS can be used for bulk composition and in-depth trace element distribution analysis.
Blue Scientific is now official distributor for CAMECA elemental and isotopic microanalysis instruments in the UK, Ireland and Finland.