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Posts Tagged ‘semiconductors’

Silicon Wafer Contamination

Identifying Contaminants on Semiconductors with Nanoscale IR Spectroscopy

Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.

EBIC (Electron-Beam Induced Current)

What is EBIC? (Electron-Beam Induced Current)

EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.

Analysing Geological Samples with WDXRF

Analysing Elemental Distribution in Rocks with XRF (Coltan)

How to analyse elemental distribution in rocks with XRF. In this case study we look at columbite-tantalite (coltan) in rocks from Canada, with the Bruker S8 TIGER Series 2 WDXRF spectrometer. Blue Scientific is the official distributor for Bruker XRF in the Nordic region (Norway, Sweden, Denmark, Finland, Iceland). For more information or quotes, please get in […]