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Posts Tagged ‘silicon’

Silicon Wafer Defects

Characterising Semiconductors with Raman Spectroscopy

How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.

High temperature SEM indentation

High Temperature In-Situ Mechanical Testing

High temperature in-situ mechanical testing, using a Hysitron PI series SEM PicoIndenter. A study of indentation on silicon at extreme temperatures.  Contact us View our scientific instruments SEM PicoIndenter The Hysitron PI Series SEM PicoIndenter is a depth-sensing mechanical test system designed to interface with a wide range of scanning electron microscopes (SEM). They uniquely couple the ability to acquire quantitative nano-mechanical […]