How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
High temperature in-situ mechanical testing, using a Hysitron PI series SEM PicoIndenter. A study of indentation on silicon at extreme temperatures. Contact us View our scientific instruments SEM PicoIndenter The Hysitron PI Series SEM PicoIndenter is a depth-sensing mechanical test system designed to interface with a wide range of scanning electron microscopes (SEM). They uniquely couple the ability to acquire quantitative nano-mechanical […]
