Characterising Semiconductors with Raman Spectroscopy
How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
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High Temperature In-Situ Mechanical Testing
High temperature in-situ mechanical testing, using a Hysitron PI series SEM PicoIndenter. A study of indentation on silicon at extreme temperatures. [icon
