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PI 85L SEM PicoIndenter

Bruker Hysitron

Bruker Hysitron PI 85L

Compact in-situ nanomechanical test system for SEM

The PI 85L SEM PicoIndenter is a depth-sensing nanomechanical test instrument for Scanning Electron Microscopes (SEM). Perform quantitative nanomechanical testing while simultaneously imaging with your SEM. Coupling these techniques also enables extremely accurate probe positioning.

  • Nanoindentation, compression, tension and bending test modes
  • In-situ data displayed beside SEM imaging for a complete picture of your sample’s behaviour
  • Compact design for small chamber SEMs, Raman, beamlines and optical microscopes
  • Optional upgrades for extra capabilities, including heating and electrical characterisation

Contact us for more information and quotes:
+44 (0)1223 422 269 or info@blue-scientific.com

Hysitron PI 85L brochure Contact us

Bruker Hystiron PI 85L SEM PicoIndenter

Nanomechanical Testing

Applications

  • Multiphase materials
  • Pillars, particles & other structures
  • 1D & 2D materials
  • Interfaces & coatings

Benefits

  • Simultaneous testing & imaging
  • Watch the deformation process in-situ
  • Accurate probe positioning
  • Ideal for small chamber microscopes

Testing Modes

Nanoindentation

Nanoindentation

  • Precise positioning
  • Nanoscale load and depth control
  • Determine fundamental mechanical properties eg hardness and elastic modulus
  • Suitable for a wide variety of materials

Tensile Testing

Tensile

  • Direct-Pull and Push-to-Pull (PTP) testing
  • Test dog-bone specimens, thin films and nanowires
  • Measure stress-strain behaviour in-situ
  • Study low dimensional materials not easily tested with traditional methods.

Bend Testing

Bending

  • Align loads and measure accurately with SEM imaging
  • Measure bending stiffness and fracture toughness
  • Single-phase, composite or layered materials.

Compression Testing

Compression

  • Compress pillars, particles and other small scale structures
  • Measure stress-strain behaviour and yield properties
  • Simultaneously observe deformation mechanisms in real time
  • Check tip alignment with SEM imaging

Optional Upgrade Modes

  • Heating up to 800°C
  • Electrical characterisation
  • Push-to-pull device
  • nanDynamic mode
  • nanoScratch mode

 

Technical Details

The PI 85L SEM PicoIndenter is the latest generation of Hysitron’s in-situ nanomechanical testing system. It was originally designed for SEM but the low profile is also suitable for Raman, optical microscopes, beamlines and more.

  • Extremely fast 78kHz control system
  • Accommodates samples up to 10 mm thick
  • Precise sample positioning with >3 mm in all three directions (XYZ)
  • Mechanically coupled sample stage and transducer for rigid stability
  • Designed for maximum stage tilt and minimum working distance, for the best imaging set-up
  • Active vibration dampening, with proprietary Q-Control technology
  • Transducer technology with electrostatic actuation and capacitive displacement sensing

Hysitron PI 85L SEM Picoindenter in an SEM

Hysitron PI85L inside an SEM chamber