Bruker Hysitron TS 75 TriboScope
In-Situ Nanomechanical Testing for AFM
The Bruker’s Hysitron TriboScope expands the capabilities of atomic force microscopes to include quantitative nanoindentation and nanotribological characterisation.
- Interfaces with Bruker Dimension Icon, Dimension Edge and MultiMode AFMs
- Nanometre-precision test placement accuracy
- Observe post-test material deformation behaviour with in-situ SPM imaging
- Rigid probe: more reliable, repeatable and simpler than cantilever-based testing
- Measure elastic modulus, hardness, creep, stress relaxation, fracture toughness and viscoelastic properties
- Nanometre-to-micrometer length measurement
Testing Modes
Quasi-Static Nanoindentation
Study localised microstructures, interfaces, small surface features and thin films:
- Elastic modulus
- Hardness
- Creep
- Stress relaxation
- Fracture toughness
In-Situ SPM Imaging
Use the same test probe for testing and topographic imaging:
- Accurate test placementwith nanometre precision
- Characterise post-test material deformation behaviour
ScanningWear
Raster scan the test probe over the sample surface:
- Adjust the force set-point
- Quantitative wear resistance characterisation at the nanoscale
NanoScratch
Exclusive 2D lateral force transducer technology:
- Quantitative scratch/mar resistance
- Friction coefficient
- Thin film adhesion measurements
Dynamic Nanoindentation (nanoDMA III)
Continuously measure elastic-plastic and viscoelastic properties as a function of:
- Indentation depth
- Frequency
- Time
Benefits of Rigid Probes
Compliant cantilevers are used in most AFMs for mechanical and tribological testing. It can be tricky to distinguish the cantilever’s flexural and rotational stiffness from the sample’s response to stress.
The TS75 TriboScope has a rigid test probe assembly instead. This is simpler and more reliable, because force and displacement can be controlled and measured directly.
Cantilever versus rigid probe measurement
Accurate Nanoscale Characterisation
Characterise your material’s properties to the bottom of the nanoscale, with industry-leading noise floors and low thermal drift. Benefit from Bruker’s proprietary electrostatic force actuation and capacitive displacement sensing transducer technology for accurate results.
Fast Response
The TriboScope responds quickly to material deformation transient events and accurately reproduces requested test functions, withclosed-loop force and displacement control and a 78 kHz feedback loop rate.