Gain an enhanced understanding of your sample’s chemical and compositional properties.

Advanced STEM detectors: HAADF, ADF and BF/DF detectors for EELS. Maximise electron collection with specially optimised detectors, to gain greater insights into your sample’s chemical and compositional properties.
Gain an enhanced understanding of your sample’s chemical and compositional properties.
With broad range.
Seamless data collection
Gatan advanced STEM detectors work with EELS systems to collect the whole angular range of scattered electrons seamlessly. For EELS mapping and STEM (Scanning Transmission Electron Microscopy) imaging, it’s vital to control the detector angle for collecting and interpreting data effectively.