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Phenom ParticleX AM
Thermo Scientific

The Thermo Scientific Phenom ParticleX AM is a desktop SEM (Scanning Electron Microscope) for additive manufacturing analysis, for large samples up to 100 mm x 100 mm.

  • Monitor critical characteristics of metal powders.
  • Identify particle size distribution, individual particle morphology and foreign particles.
  • Apply to powder-bed and powder-fed additive manufacturing processes.


Large samples

Up to 100mm x 100mm

Fastest vent/load cycle in the world

Bring SEM analysis in-house

Easy to use

Fast to learn


Why have SEM in-house?

A growing number of manufacturing companies are using SEM analysis in-house instead of outsourcing. This equips you with a range of automated analyses, chemical classification and verification according to specified norms.

The Thermo Phenom ParticleX is fast, to support production with accurate verification and classification of materials. It’s automated and can analyse multiple samples for high throughput.

Outsourcing can take up to 10 working days, whereas with the Phenom ParticleX results are ready within a day. It’s simple to operate, fast to learn and doesn’t take up too much space as a desktop instrument.

The Phenom ParticleX can also take on tasks from other SEMs in the lab – for example particle analysis of metal powders at the microscale for the additive industry, and confirming that components fulfill technical cleanliness specifications (according to VDA19 or ISO16232 standards).

High Throughput

Thermo’s proprietary venting/loading mechanism gives you the world’s fastest vent/load cycle, with an industry-leading sample-loading time of 60 seconds or less. This provides higher throughput than other SEM systems.

Additive Manufacturing Parameters

Measure various size and shape parameters with 10%, 50%, 90% values (e.g. d10, d50, d90):

  • Minimum and maximum diameter
  • Perimeter
  • Aspect ratio
  • Roughness
  • Feret diameter

Elemental Mapping and Line Scans

It’s easy to perform line scans and elemental mapping: simply click and go! Element mapping visualises the distribution of elements. Line scans show the quantified element distribution in a line plot – particularly useful for coatings, paints and applications with multiple layers, for analysing edges, coatings, cross sections, etc. Reports can then be exported easily using templates.

Secondary Electron Detector (optional)

An optional secondary electron detector is available for the Phenom ParticleX AM. This collects low-energy electrons from the top surface layer, for detailed information about the surface. This is useful in applications where topography and morphology are important eg microstructures, fibres or particles.

Size and Weight

  • Imaging module
    Size: 316mm (w) x 587mm (d) x 625mm (h)
    Weight: 75 kg
  • Diaphragm vacuum pump
    Size:145mm (w) x 220mm (d) x 213mm (h)
    Weight: 4.5 kg
  • Power supply
    Size: 156mm (w) x 300mm (d) x 74mm (h) mm
    Weight: 3 kg
  • Monitor
    531.5mm (w) x 515.4mm (h) x 250mm (d)
    Weight: 6.7 kg
  • Workstation
    Size: 169mm (w) x 456mm (d) x 432mm (h)
    Weight: 15 kg


Media Gallery

Phenom ParticleX Desktop SEM – Quality Starts at the Microscale

The Thermo Scientific Phenom ParticleX AM is perfect for the routine inspection of materials, when the identification and reporting of particle sizes, shapes, and elemental chemistry are critical to manufacturing operations.

Additive manufacturing requires feedstocks to be examined carefully, particularly when recycled powders are used, to ensure the integrity of printed materials and to maintain batch-to-batch consistency.

  • ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
  • ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
  • Particle morphology for additive manufacturing feedstocks.
  • Workflow examples for particle classification and reporting.
Watch the recorded webinar


How to Choose a SEM

A recorded webinar from Thermo Scientific about how to match the features and specification of a SEM to the requirements of your application.

  • How different samples and applications require different resolution performance.
  • What performance you can expect from a tungsten / FEG / in-lens FEG / UC FEG.
  • Dealing with different types of samples: insulators, nanomaterials, sensitive materials, etc.
  • Characterising samples in their natural state without the need for sample preparation.
  • What type of information the SEM can provide.
  • Software features to boost productivity and ease-of-use.
Watch the recorded webinar


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