Bruker Webinar: Scanning Probe Microscopy and Nano-Indentation for Semiconductor Failure Analysis and Reliability

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April 13, 2023 Amy Crabtree

Interested in scanning probe microscopy? Why not join Bruker at their latest webinar on the 19th April.

This webinar addresses how scanning probe microscopy (SPM) and nanoindentation can advance failure analysis and reliability testing in the semiconductor industry.

Bruker experts will use and present several examples to illustrate how our nanomechanical test instruments have been developed.

Discover more: https://mbns.bruker.com/acton/fs/blocks/showLandingPage/a/9063/p/p-0331/t/page/fm/1%20

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About the Author

Amy Crabtree has worked in scientific communications in the UK for ten years, with experience of a range of technologies including NMR, Mass Spectrometry, X-Ray Analysis and Infrared Spectroscopy.