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OnPoint BSE Detector

The Gatan OnPoint is a backscattered electron detector for SEM (Scanning Electron Microscopes). Study non-conductive samples including polymers, plastics and biological materials. Optimised for low kV, for studying uncoated biological samples, low atomic number (Z) elements and large 3D datasets.


Acquire large 3D datasets

And fields of view

< 5 kV beam energy

For a wide range of samples

Differentiate low-Z elements

High collection efficiency

Low noise


  • Resolve features distorted by charging or beam damage: Low kV to reduce charge build-up and protect delicate samples
  • Capture large, 3D datasets quickly: Up to 6 times faster for large field of view images and 3D.
  • Differentiate low-Z elements: Highest signal-to-noise ratio (SNR) available, to distinguish between elements with similar atomic numbers.
  • Highest BSE collection efficiency: Capture electrons that other detectors miss, with minimal noise.
  • Optimum performance within minutes: Maintain the best performance without the need for service visits, with user-exchangeable sensors.


  • Neuroscience
  • Cell biology
  • Natural resources
  • Alloys (Al, Mg)
  • Plastics, polymers


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