Stylus Profiling Metrology for Soft Matter
Join Bruker for a stylus profilometry webinar about measuring film thickness and depth in flexible electronic and microfluidic devices. The presentation will include evidence of how advanced stylus profiling extends to fragile surfaces such as PEDOT:PSS photovoltaic materials, PDMS microfluidic channels or amorphous-indium-gallium-zinc-oxide (IGZO) transistors. A successful solution relies on precise and low controlled force keeping topography unchanged while retaining sub-nanometer repeatability. Through these attributes, the DektakXT stylus profiler opens a wider range of applications for thickness metrology, from nm to mm.