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Bruker Innova
Bruker Nano

The Bruker Innova AFM delivers accurate, high-resolution imaging and a wide range of functionality for physical, life and material science research. The Innova is designed to be flexible and easy to use, as well as to fit your budget at a moderate cost.

  • – Lowest noise and highest AFM resolution in its class.
  • – Economical system with complete AFM capabilities.
  • – Easy set-up and fast research-quality results.


Economical system

Excellent functionality and high resolution.

Lowest closed-loop noise and drift

Fast and easy to use

With pre-configured software settings.

Full range of SPM modes


With TERS-enabled AFM-Raman integration.


The Innova features a unique, state-of-the-art closed-loop scan linearisation system for accurate measurement and noise levels approaching those of open-loop standard. Achieve atomic resolution and scans up to 90 microns, without changing scanner hardware. The integrated, high-resolution colour optics and programmable, motorised Z-stage make it quick and simple to find features and change tips or samples.

Full Range of SPM Modes

The Bruker Innova offers a complete choice of SPM techniques, for applications including photovoltaics, energy storage, surface science, device characterisation, biomolecules and semiconductors. A host of standard and optional scan modes enables complete surface characterisation of samples in both air and liquid.

  • Contact Mode
  • TappingMode™
  • PhaseImaging™
  • LiftMode
  • Dark Lift
  • Nano-Indentation
  • Nanolithography
  • Open Hardware Access
  • Device synchronization
  • Piezo Response Microscopy
  • Magnetic Force Microscopy (MFM)
  • Electrostatic Force Microscopy (EFM)
  • Force Modulation Microscopy (FMM)
  • Scanning Tunneling Microscopy (STM)
  • Low-Current Scanning Tunneling Microscopy (LC-STM)
  • Electrochemical Scanning Probe Microscopy (ECSPM)
  • Single and dual-pass Kelvin Probe Force Microscopy (KPFM)
  • Conductive Atomic Force Microscopy (CAFM)
  • Scanning Capacitance Microscopy (SCM)
  • TERS-enabled AFM-Raman integration (IRIS™)
  • Nano Thermal Analysis (VITA™)


 Bruker Innova - materials science applications

Materials Science and Polymers

To design heterogeneous composite materials and choose from the wide range of of polymer chemistries and nanoscale building blocks available, it’s important to be able to map properties at high spatial resolution. In applications from structural materials to organic photovoltaics, critical bulk properties are affected by microphase separations and the distribution of additives and fillers. To address these characterisation needs, the Bruker Innova has a full suite of nano-mechanical and -electrical modes, from phase imaging and force spectroscopy to piezo-response force microscopy, conductive AFM and Kelvin probe force microscopy. This functionality is also offered by the Dimension Edge.


 Nanoelectrical measurement

NanoElectrical Measurement

AFM-based nanoscale electrical characterisation is commonly used in semiconductor R&D and failure analysis. Scanning capacitance provides maps of active carrier density, and conductive AFM probes device connectivity and gate oxide breakdown characteristics.

Nanoscale electrical properties also play a key role in research areas from graphene to conductive polymers, using AFM electrical modes such as conductive AFM, Kelvin probe force microscopy (KPFM) and electric force microscopy (EFM).

The Bruker Innova offers a full suite of electrical modes, including:

  • Bruker’s patented LiftMode for electric field gradient mapping with EFM
  • Sensitive KPFM workfunction mapping
  • Artefact-free conductivity mapping with Dark-Lift conductive AFM
 Combined AFM and Raman spectroscopy

AFM-Raman and TERS

AFM and Raman spectroscopy provide highly complementary information:

  • AFM produces high resolution surface structure and nano-mechanical and -electrical property information.
  • Raman spectra reveal vibrational spectroscopic signatures to identify chemistry and crystallography (or graphene electronic structure), as well as being label-free and non-destructive.

Combined AFM and Raman spectroscopy also facilitate tip-enhanced Raman spectroscopy (TERS), bringing Raman spatial resolution into the nano-scale. Innova (as Innova-IRIS) is an ideal platform for AFM-Raman and TERS, with stable hardware and software for integration.

 Biological research with AFM

Biological Research

Analyse biological samples from single biomolecules to isolated membranes and whole live cells. The high resolution surface probe can work in-situ inside liquids, opening up life science application possibilities. Studies of live cells highlight cell responses to external stimuli. AFM research into isolated membranes reveals phase segregations and has even provided molecular-level detail structure and bonding informationn, for example on bacterio rhodopsin. Tapping mode in-situ AFM imaging and thermal-tune calibrated force spectroscopy of individual DNA and protein molecules can elucidate secondary structure and the potential energy landscape governing unbinding forces.


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