Materials Science
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Nanotechnology and Nanomaterials
- Ultratrace element analysis of nanoparticles using TXRF trace analysis – Application Note – Bruker S2 PICOFOX
- Studying defects in GaN structures with AFM – Case study
Corrosion
- Mapping water uptake in organic coatings – Paper
- Detect impurities in coal, coke and carbon products that may cause corrosion – more info
- Analyse elemental distribution on corroded areas, including coated samples, using micro-XRF:
- Bruker M4 Tornado
- Application Note
- See lots of example images in our micro-XRF ebook
Thin Films and Coatings
- Mapping water uptake in organic coatings – Paper
- Characterise multilayer films with IR spectroscopy at sub-micron resolution – Article – O-PTIR
- Chemical analysis of coatings with Raman spectroscopy – details
- Correlated chemical and mechanical information with combined Raman and nanoindentation – more info
- Surface adhesion property mapping at the nanoscale with AFM and Bruker Ringing Mode eg to investigate the properties of surface coating molecules – more details…
- Thermal barrier coating failure analysis with SEM-EDS
- Elemental analysis of layers and coatings
- Bruker M1 ORA Micro-XRF
- Brochure: Layer Analysis with Micro-XRF
- Application note: Analysing thin layers under vacuum
- Application note: Analysing jewellery alloys
- See lots of example images in our micro-XRF ebook
Failure Analysis
- Wear debris – analyse and identify small particles using micro-XRF – Bruker M4 Tornado – Application Note
- SEM-EDS in metals failure analysis – more details…
- SEM-EDS for identifying defects and contaminants in polymers and composites – more details…
- Element mapping with micro-XRF – See lots of example images in our micro-XRF ebook
- Chemical analysis of coatings with Raman microscopy
- Simultaneous IR and Raman spectroscopy
- Analysing fibres with micro-CT
Electrochemistry Research
- Non-destructive internal imaging eg electrolytic capacitors – Bruker microCT
Other Applications
- Geology
- Mineral analysis with micro-XRF – More info
- Element distribution analysis of geological samples using micro-XRF – Bruker M4 Tornado – Application Note
- Element mapping of geological thin sections using micro-XRF – Bruker M4 Tornado – Application Note
- Elemental analysis of large geological samples using micro-XRF – Bruker M6 Jetstream – Application Note
- Dynamic process imaging using 4D micro-CT eg weathering, movement of fluids, crystallisation – Article
- Archeometry
- Non-destructive elemental analysis of archeological objects using micro-XRF – Bruker M4 Tornado – Application Note
- Precious Metals
- Analysis of gold containing traces of other metals using micro-XRF – Bruker M1 Mistral – Application Note
- Analysing jewellery alloys using micro-XRF – Bruker M1 Mistral – Application Note
- Analysing jewellery alloys using the M1 Ora and M1 Mistral micro-XRF – Application Note
- Fibres
- Analysing fibres with micro-CT – Article – Bruker Micro-CT instruments
- Glass
- Analysing traces of mercury in glass using TXRF trace analysis – Application Note – Bruker S2 PICOFOX
