Semiconductors
Semiconductors
- Characterising semiconductors with Raman Spectroscopy
- Organic contamination identification and failure analysis – Article – Bruker Anasys nanoIR3
- Simultaneous IR and Raman spectroscopy – details
- Compositional measurement of nanometre-size SiGE devices with self-focusing SIMS (ten times faster than TEM or APT) – More details…
- Mapping defects on UWBG (Ultra Wide BandGap) semiconductor materials with Cathodoluminescence – details…
- RoHS (Restriction of the Use of Hazardous Substances) – Map elements and detect traces of toxic substances using micro-XRF
About the Author
Tom Warwick has extensive experience of nanometer-scale, metrology and industrial laboratory instrumentation, with a background in nanotechnology and nanofabrication.
