+44 (0)1223 422 269 Contact
Bruker Dimension XR
Bruker Nano

The Bruker Dimension XR is an SPM (Scanning Probe Microscope) for nanomechanics, electrical AFM and nanoelectrochemistry.

  • – Three models, with configurations optimised for: nanomechanics, electrical AFM and nanoelectrochemistry.
  • – Choose either the Bruker Dimension Icon or Dimension FastScan platform.
  • – Unique technologies including Bruker’s PeakForce Tapping, DataCube modes, SECM and AFM-nDMA.
  • – Quantify materials and active nanoscale systems in air, fluid, electrical or chemically reactive environments.


Three models, two platforms

Choose the configuration that suits your research.

Exclusive nanoelectrical modes

A wealth of information with Bruker DataCubes.


For energy research.

New AFM-nDMA mode

For viscoelastic measurements tied directly to bulk DMA (Dynamic Mechanical Analysis).

Out-of-the-box nanomechanical analysis

Quantifiable nanoscale characterisation from soft, sticky hydrogels and composites to stiff metals and ceramics.


Three models are available with packages optimised for each application:

Dimension XR Nanomechanics


For characterising the nanomechanical characteristics of materials.

  • Detect the smallest structures with spatial resolution down to sub-molecular units of polymer chains.
  • Correlative nanomechanics characterisation to bulk DMA and nanoindentation methods with AFM-nDMA mode.
  • Quantifiable nanoscale characterisation from soft, sticky hydrogels and composites to stiff metals and ceramics.

Bruker Dimension-XR SPM


The widest range of electrical AFM techniques on a single system.

  • DataCube modes acquire electrical spectra at every pixel correlated with mechanical property measurements.
  • Information previously unattainable from a single measurement.



In-situ topography scans in an electrochemical environment.

  • Turn-key system for real-time quantitative analysis of local reactivity at the nanoscale.
  • Robust AFM-based scanning electrochemical microscopy (AFM-SECM) and electrochemical AFM (EC-AFM).
  • Electrochemical information with <100 nm spatial resolution.
  • Simultaneous electrochemical, electrical and mechanical mapping in solution.

Consistent High Resolution

The Dimension XR series consistently delivers the highest resolution imaging, regardless of sample size, weight, medium or application.

From point defects in liquid and stiffness maps to atomic resolution in air and conductivity maps, Dimension XR systems deliver highest resolution in all measurements.


For the first time, AFM provides complete and quantitative viscoelastic analysis of polymers at the nanoscale. Probe materials at rheologically relevant frequencies in the linear regime.

More about AFM-nDMA…

DataCube Modes

Bruker’s proprietary DataCube modes give you complete materials characterisation, with more information about your sample than was previously possible. By correlating mechanical and electrical data at each pixel, you can gain a deeper understanding of a material’s properties.

A force-distance spectrum is collected at every pixel, with a specified dwell time. Using high data capture rates, a multitude of electrical measurements are performed, delivering electrical and mechanical spectra at every pixel.

For the first time, a commercial AFM provides full characterisation in a single experiment.

More about DataCube modes…

PeakForce SECM

PeakForce SECM mode redefines what’s possible in the nanoscale visualisation of electrical and chemical processes in liquid, with a spatial resolution less than 100 nm.

Resolving power is dramatically improved compared to traditional methods, by orders of magnitude. This opens up new research possibilities in energy storage systems, corrosion science and biosensors, and new measurements on individual nanoparticles, nanophases and nanopores.

PeakForce SECM simultaneously captures topographic, electrochemical, electrical and mechanical maps with nanometer-scale lateral resolution.

More about PeakForce SECM…

Media Gallery


Contact Us

  • This field is for validation purposes and should be left unchanged.