Nordic AFM User Meeting: 25th April 2024
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
scanning probe microscopy
News
NEW Bruker Dimension-XR Scanning Probe Microscopes
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
News
High Resolution KPFM with Bruker PeakForce KPFM
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
News
Nordic SPM Conference & User Meeting 2018: 10-11 October 2018
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
Events
Scanning Probe Microscopy Meeting 2016
Visit us at the Scanning Probe Microscopy Meeting 2016 on 6-7 July 2016 at the University of Warwick.
