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Posts Tagged ‘scanning probe microscopy’

NEW Bruker Dimension-XR Scanning Probe Microscopes

New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.


High Resolution KPFM with Bruker PeakForce KPFM

How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).

Nordic SPM Conference 2018

Nordic SPM Conference & User Meeting 2018: 10-11 October 2018

Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.

Scanning Probe Microscopy Meeting 2016

Scanning Probe Microscopy Meeting 2016

Visit us at the Scanning Probe Microscopy Meeting 2016 on 6-7 July 2016 at the University of Warwick.