New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
