Category Archive for ‘AFM’

A scientific paper has been published in Advanced Materials about studying adhesion in 2D materials with AFM, using the Bruker MultiMode 8.

Bruker’s Contact Resonance module is for mechanical characterisation of stiff biological samples, polymers and metals with AFM (Atomic Force Microscopy). Until now it was not possible to study the nanomechanical properties of samples such as teeth, bones, seeds, wood and medical implants with this level of accuracy.

Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.

A new Scanning Electrochemistry option is available for the Bruker JPK NanoWizard BioAFM series. AFM-based SECM is used for electrochemical mapping at nanoscale resolution.

The Bruker JPK NanoRacer is a biological AFM (Atomic Force Microscope) with speeds of up to 50 frames per second for studying dynamic biological processes in real time.

Join Bruker for a series of free online training sessions over the next few weeks, covering nanoscale surface analysis topic.

Celebrating the 10th anniversary of PeakForce Tapping, the fastest growing AFM mode.

An overview of how Atomic Force Microscopy can be used in battery research.

Join us for a two day conference in Copenhagen about AFM and nanoscale IR spectroscopy (AFM-IR, s-SNOM and O-PTIR).

The Bruker JPK NanoWizard 4 XP is a new, high resolution, large format biological AFM system