Tribology Testing and Metrology Workshop with Bruker – NORDTRIB 2016, Finland
Tribology Testing and Metrology Workshop with Bruker
Join us for a Tribology Testing and Metrology Workshop with Bruker on the afternoon of Thursday 16th June 2016 in Finland. The workshop is at NORDTRIB 2016 Nordic Symposium on Tribology, at the Rantasipi Aulanko Hotel in Hämeenlinna, Finland.
- See live demonstrations on the Bruker UMT Tribolab tribology test system and the Bruker Contour optical profiler
- Talks from tribology applications scientists from Bruker – with opportunities to discuss your research
- Bring your own samples to test, and see the results live!
Blue Scientific is the exclusive distributor of Bruker Nano surface analysis instruments in the Nordic region (Norway, Finland, Denmark and Sweden). If you have any questions please get in touch:
Thursday 16th June 2016
Rantasipi Aulanko Hotel, Finland
Dr Stephen Badger, Blue Scientific
|Tribology and Mechanical Testing with the Bruker Tribolab
Dr. Steve Shaffer, Bruker and Chairman, ASTM G-02 Committee on Wear and Erosion
|Tribology Surface Profiling with the Bruker Contour Microscope
Dr. Khaled Kaja, Bruker
|Practical Demonstration – Bruker Tribolab
Dr. Steve Shaffer, Bruker
|Practical Demonstration – Bruker Contour Optical Microscope
Dr. Khaled Kaja, Bruker
This event has now passed. If you would like more information about our tribology instruments, please get in touch.
If you have any questions, please contact us.
Bruker UMT TriboLab
The Bruker UMT (Universal Mechanical Tester) TriboLab is a versatile instrument for testing the mechanical and tribological properties of materials. It is the most widely used tribometer on the market, with higher speeds, more torque and better force measurement than alternative systems. The modular platform can be transformed in minutes from rotary to reciprocating motion, from sub-newton to kilo-newton force measurement, or from room temperature up to 1000°C for environmental testing.
Bruker Contour Optical Profiler
The Bruker Contour is a surface profiler for imaging and metrology of a wide range of surfaces. The system includes an extensive library of pre-programmed filters and analyses for measuring LEDs, solar cells, thick films, semiconductors, ophthalmic and medical devices and MEMS, as well as other tribology applications. With unmatched Z-axis resolution and accuracy, the Contour GT-K delivers all the benefits of white light interferometry, without the deficiencies of conventional confocal and standard digital microscopes.[hr]