Midlands SEM Users Meeting – MIDSEM 2015
Visit us at MIDSEM 2015, the Midlands SEM Users Meeting on Wednesday 27th May at the University of Birmingham. Don’t miss Rob Claasen’s talk “Recent innovations in in-situ SEM nano mechanical characterisation”.
Contact us on 01223 422 269 or email@example.com
MIDSEM 2015 – Midlands SEM Users Meeting
MIDSEM 2015 is set to be an interesting and informative day for those interested in SEM. Topics will cover SEM and FIBSEM, including both materials science and life sciences. The scientific conference features:
- Programme of talks from invited speakers – see full programme below.
- Trade forum where you can discover new electron microscopy applications.
- Trade exhibition with major companies involved in electron microscopy, analysis, service and consumables.
- Free buffet lunch for all delegates.
Book an In-Situ SEM Demo
In conjunction with the conference we’re running personal in-situ SEM demonstrations. Bring your own samples, try the instruments for yourself and get a feel for what the technology can do. Advance booking is required – click here for further details.
Registration is free of charge (the meeting is sponsored by trade exhibitors). The organisers request that you register in advance, to give them an idea of numbers.
To register for MIDSEM 2015, please email Paul Stanley: firstname.lastname@example.org
Conference Venue and Directions
The Midlands SEM Users Meeting will be held on 27th May at the University of Birmingham, at the Centre for Electron Microscopy, which is in the Metallurgy and Materials building. Directions to the university and a campus map are available on the University of Birmingham’s website.
MIDSEM 2015 Programme
09:30: Arrival, registration and coffee
10:00: Welcome – Dr. Yu Lung Chiu, University of Birmingham
10:05: The origin of orientation contrast using an “in lens” secondary detector
Professor M Lorretto, University of Birmingham
10:45: Examination of Structured Surfactant Personal Care Formulations using Cryo-SEM
Richard Morris, Morris Analytical X-Rays
11:30: Recent Innovations in in-situ SEM Nano Mechanical Characterisation
Rob Claassen, Blue Scientific
11:45: From A to See… Workflow solutions for EM
Steve Murray, Hitachi High-Technologies
12:00: RMC ATUMtome – Automating Serial Sectioning for 3D Applications
Natalie Hackett, ISS Group Services
12:15: XFlashR Annular Four Channel SDD – Applications for the Flat QUAD
Chuan Wei Chung, Bruker UK
12:30: The Quorum Quality Approach to Carbon Coating
Trevor Groves, Quorum Technologies
12:45: Lunch and Trade Exhibition
14:00: Deformation Related Micro-Mechanisms in Zirconium
Dr Leo Prakash, University of Swansea
14:30: Electron Channelling Contrast Image of Shock Induced Dislocations in Tantalum Single Crystals
Bo Pang, University of Birmingham
15:00: Tea, biscuits and close