Mapping water uptake in organic coatings – Paper Characterise multilayer films with IR spectroscopy at sub-micron resolution – Article – O-PTIR Chemical analysis of coatings with Raman spectroscopy – details Correlated chemical and mechanical information with combined Raman and nanoindentation – more info Surface adhesion property mapping at the nanoscale with AFM and Bruker Ringing Mode eg to investigate the properties of surface coating molecules – more […]
XRD Combined with TOPAS Rietveld analysis, XRD is a powerful technique for quantitative phase analysis of hotmeal, bypass, kiln dust, clinker and cement. Perform direct phase analysis throughout the entire production process, from raw materials, intermediate products like hotmeal and dusts to clinker and the final cement. Distinguish the Alite polymorphs M1 & M3 and quantify amorphous phases by the […]
Art Conservation Workshop Videos Watch videos of the talks from our workshop at the National Gallery. Operation Nightwatch at the Rijksmuseum An innovative exhibition and research project, where the public can watch researchers studying Rembrandt’s painting “The Night Watch” with scientific techniques including micro-XRF. More details… National Gallery in London The National Gallery in London […]
XRM for Pharmaceuticals and Medical Devices XRM for Pharmaceuticals and Medical Devices A pdf brochure from Bruker about how X-ray microscopy (aka micro-CT) is used for non-destructive 3D internal imaging in production, inspection and failure analysis of tablets and medical devices.
Raman The Renishaw InVia InSpect is optimised specifically for forensic labs. With Raman you can identify materials that would be difficult or time consuming using other techniques, such as hard crystalline powders, ceramic shards and glass chips, as well as paint, gun shot residue and more. In this image the Raman image shows that two […]
Characterising semiconductors with Raman Spectroscopy Organic contamination identification and failure analysis – Article – Bruker Anasys nanoIR3 Simultaneous IR and Raman spectroscopy – details Compositional measurement of nanometre-size SiGE devices with self-focusing SIMS (ten times faster than TEM or APT) – More details… Mapping defects on UWBG (Ultra Wide BandGap) semiconductor materials with Cathodoluminescence – […]