Thin Films and Coatings


XRD (X-Ray Diffraction) provide non-destructive characterisation of thin layer structured samples. The Bruker D8 DISCOVER and DIFFRAC.SUITE software make it easier to perform common XRD tasks in thin film analysis:

  • Grazing Incidence Diffraction (GID) for Surface sensitive Identification of crystalline phases and determination of their structural properties including crystallite size and strain.
  • X-ray reflectometry (XRR) for thickness, material density and interface structures in multi-layer samples, from simple substrates to highly complex super-lattice structures.
  • High-resolution X-Ray Diffraction (HRXRD) for epitaxial grown sample structures: layer thickness, strain, relaxation, mosaicity and composition analysis of mixed crystals.
  • Stress and texture (preferred orientation) analysis

More about the Bruker D8 ADVANCE…

Elemental mapping

Example: Thermal Barrier Coating Failure Analysis

A case study of how SEM-EDS was used for failure analysis of thermal barrier coating in a turbojet engine, for materials development in aerospace engineering.

Read the case study…