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The D8 ADVANCE series of X-ray diffractometers is a versatile platform, with models including the ECO with no external water cooling to the Plus featuring the latest X-ray diffraction components. All D8 ADVANCE systems are housed in a convenient cabinet with a reliable D8 goniometer.


All XRD applications

Powder XRD, PDF analysis, SAXS and WAXS

Market-leading accuracy

Peak positions, intnsities and resolution.

Easy configuration

Tool and alignment free, with automatic component recognition.

All sample types

Liquids, loose powders, thin films and solid blocks.



The Bruker D8 ADVANCE is available in various configurations to focus on a specific analytical task, or as a multipurpose system:


  • D8 ADVANCE ECO – Full-sized goniometer class powder XRD, under ambient and non-ambient conditions.
  • D8 ADVANCE Twin – Best powder XRD performance. Push-button switching between amorphous and polycrystalline thin film analysis under ambient and non-ambient conditions.
  • D8 ADVANCE Plus – XRD for all sample types, including epitaxial thin films under ambient and non-ambient conditions.

Specific Applications

  • D8 ADVANCE for XRD² – Collect data in both 2Theta and Gamma directions, to study the properties of crystalline materials.
  • D8 ADVANCE for Stress – Measure stress and texture on machined parts, thin films and bulk samples.
  • D8 ADVANCE for Structure Analysis – Gather structural information from X-Ray Powder Diffraction with Rietveld (TOPAS) analysis, diffuse or “total” scattering (PDF analysis) and Small Angle X-Ray Scattering (SAXS).

Dynamic Beam Optimisation

Dynamic Beam Optimisation ensures the highest data quality, with unmatched counting statistics and peak-to-background ratios, without manual instrument reconfiguration.

The high speed energy-dispersive detector (LYNXEYE XE-T) uniquely combines fast data collection with unprecedented fluorescence and Kβ radiation filtering. Its proprietary Variable Active Detector Window and Motorised Anti-Scatter Screen (MASS) enable data collection from the lowest 2Th angles without parasitic low-angle background scattering, in particular air scattering. Fully automated MASS retraction avoids beam cropping, even in combination with continuously variable slits for excellent counting statistics across the entire range.

  • Fast data collection and high throughput.
  • Superior data quality for pharmaceutical, clay, zeolite samples and more, with no parasitic low-angle background scattering.
  • Best peak-to-background ratio for greater sensitivity in minor phases.
  • Full quantification of crystalline and amorphous phases.

TRIO – Three in One Optics

New TRIO™ optics are key component of the new D8 ADVANCE Plus. A single optic can meet the needs of all three most commonly used X-ray diffraction geometries:

  • Divergent beam for conventional powder diffraction (XRPD)
  • High intensity parallel beam for:
    • Capillary experiments
    • Height insensitive measurements,
    • Surface sensitive grazing incidence geometry (GID)
    • Coating thickness determination (XRR)
    • Micro-diffraction (μXRD)
  • Pure Cu-Kα1 parallel beam for high resolution diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples

Switch easily between beam geometries. Instrument alignment is fully software-controlled, requiring no user intervention.

Modular System

Known as Bruker’s “DAVINCI design”, the D8 ADVANCE is a completely flexible, modular XRD system. It can be adapted easily to any XRD application.

Change easily from one beam geometry to another and exchange individual components, including the the X-ray tube, optics, sample stages and detectors.

  • Push-button TWIN or TRIO optics changing with software control
  • Switch optics and wavelengths easily with SNAP-LOCK
  • Real-time component recognition and status display
  • Convenient solutions for sample mounting and positioning

X-Ray Detectors

The D8 ADVANCE is compatible with Bruker’s EIGER2 R series of HPC X-ray detectors:


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