Powder XRD, PDF analysis, SAXS and WAXS

The D8 ADVANCE series of X-ray diffractometers is a versatile platform, with models including the ECO with no external water cooling to the Plus featuring the latest X-ray diffraction components. All D8 ADVANCE systems are housed in a convenient cabinet with a reliable D8 goniometer.
Powder XRD, PDF analysis, SAXS and WAXS
Peak positions, intnsities and resolution.
Tool and alignment free, with automatic component recognition.
Liquids, loose powders, thin films and solid blocks.
The Bruker D8 ADVANCE is available in various configurations to focus on a specific analytical task, or as a multipurpose system:
Multipurpose
Specific Applications
Dynamic Beam Optimisation ensures the highest data quality, with unmatched counting statistics and peak-to-background ratios, without manual instrument reconfiguration.
The high speed energy-dispersive detector (LYNXEYE XE-T) uniquely combines fast data collection with unprecedented fluorescence and Kβ radiation filtering. Its proprietary Variable Active Detector Window and Motorised Anti-Scatter Screen (MASS) enable data collection from the lowest 2Th angles without parasitic low-angle background scattering, in particular air scattering. Fully automated MASS retraction avoids beam cropping, even in combination with continuously variable slits for excellent counting statistics across the entire range.
New TRIO™ optics are key component of the new D8 ADVANCE Plus. A single optic can meet the needs of all three most commonly used X-ray diffraction geometries:
Switch easily between beam geometries. Instrument alignment is fully software-controlled, requiring no user intervention.
Known as Bruker’s “DAVINCI design”, the D8 ADVANCE is a completely flexible, modular XRD system. It can be adapted easily to any XRD application.
Change easily from one beam geometry to another and exchange individual components, including the the X-ray tube, optics, sample stages and detectors.
The D8 ADVANCE is compatible with Bruker’s EIGER2 R series of HPC X-ray detectors:
We offer a range of instruments for elemental and mineral analysis, mapping and imaging in geology and geoscience.
Instruments for measuring thin films and coatings.
Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
Analytical techniques for process control of manufacturing involving metal powders. How XRD, XRF and micro-CT are used for failure analysis, element composition and mapping, crystalline phase identification, parts inspection and more.
The EIGER2 R 500K is a new detector for Bruker XRD systems.
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
An overview of how analytical X-ray technology is used in drug discovery and development, to provide high-resolution molecular structures.
An overview of how X-Ray Diffraction is used in battery development and energy storage materials analysis.