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Nexsa G2 XPS for Surface Analysis
Thermo Scientific

The Thermo Scientific Nexsa is an XPS (X-Ray Photoelectron Spectrometer) with automated surface analysis and multi-technique capabilities. There are options to integrate ISS (Ion Scattering Spectroscopy), UPS (UV Photoelectron Spectroscopy), REELS (Reflected Electron Energy Loss Spectroscopy and Raman for correlative analysis. Options for sample heating and biasing further increase the range of experiment possibilities.


Fast, efficient XPS

High quality data from even the most challenging samples.

Unique multi-technique options

Unlock even more information about your sample.

Dual-mode ion source

For monatomic and cluster ion depth profiling.

In-situ sample processing

Optional heating stage and sample biasing modules.


  • Fully automated for fast time to results.
  • Optional multi-technique integration:
    • Raman
    • ISS
    • UPS
    • REELS
  • MAGCIS ion source:
    • Enhanced depth profiling capabilities.
    • Go beyond inorganic materials to polymers, biomaterials and 2D materials such as graphene.
  • X-ray spot size (which defines the analysis area) from 10 µm to 400 µm – varied in 5 µm steps.
  • Suitable for large samples.
  • Optional transfer capabilities for air-sensitive samples.

Depth Profiling

Understand how a sample’s chemistry changes into the bulk or examine the interface of layers with depth profiling. The Nexsa’s dual-mode source uses a high performance monatomic ion source for organic materials, and MAGCIS (Monatomic And Gas Cluster Ion Source) for other types of samples. These are configured automatically to ensure reproducibility, and greatly open up the types of samples you can analyse.

Wide Range of Possibilities

As well as the option to integrate other techniques seamlessly for correlative spectroscopy, a wide range of sample holders are available. As well as accommodating a variety of sample types, including powders and fibres, these also add new possibilities to your experiments. Rotating sample holders improve layer resolution during depth profiling. Use a tilting sample holder for angle-dependent XPS studies on ultra-thin films. Examine air-sensitive materials without exposure to the air, with a vacuum transfer module. Apply low voltages with a bias sample holder to measure work functions and performing charge/discharge studies. Examine how samples react to heating.


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