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Posts Tagged ‘nanoir3’

Nanosclae FTIR and s-SNOM

Advanced 2D Materials Research with Nanoscale FTIR and s-SNOM

A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.

Analysing Semiconductors with Nanoscale IR Spectroscopy

Characterise Semiconductor Materials with Nanoscale IR

How nanoscale infrared spectroscopy can be used to measure semiconductor materials in defect and contamination analysis, and fabrication.

Silicon Wafer Contamination

Identifying Contaminants on Semiconductors with Nanoscale IR Spectroscopy

Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.