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Category Archive for ‘AFM-IR’

Online Training from Bruker Nano

Online Training from Bruker Nano: AFM, Tribology, Nanoindentation and more

Join Bruker for a series of free online training sessions over the next few weeks, covering nanoscale surface analysis topic.

Analysing Semiconductors with Nanoscale IR Spectroscopy

Characterise Semiconductor Materials with Nanoscale IR

How nanoscale infrared spectroscopy can be used to measure semiconductor materials in defect and contamination analysis, and fabrication.

Silicon Wafer Contamination

Identifying Contaminants on Semiconductors with Nanoscale IR Spectroscopy

Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.

Bruker Anasys - Nordic Distributor

New Partner: Bruker Anasys NanoIR & Thermal Measurement Instruments

We’re now the official distributor for Bruker Anasys nanoscale infrared spectroscopy & thermal measurement instruments in the Nordic region (Denmark, Sweden, Finland, Iceland & Norway).

Bruker Peakforce SECM

Webinar: Bruker PeakForce SECM (Scanning Electrochemical Microscopy)

Bruker webinar about Peakforce SECM (Scanning Electrochemical Microscopy), a new AFM mode with less than 100 nanometre spacial resolution.

AFM Workshop 2016, Denmark

AFM Workshop: Latest Developments in SPM, 17/03/16, Denmark

Come to our AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark.

nanoIR2-s nanoscale IR spectroscopy with AFM-IR and s-SNOM

New Nanoscale IR Spectroscopy Platform Combines AFM-IR and s-SNOM

A new instrument from Anasys Instruments is the only nanoscale IR spectroscopy and imaging platform with both robust nanoscale IR absorption spectroscopy via AFM-IR and sub-20nm complex optical property imaging via sSNOM (scattering scanning near field optical microscopy). Follow Blue Scientific on Linked In for updates: UPDATE: This system has now been replaced with the Bruker Anasys […]

Polymer Additives Surface Blooming Identification using AFM-IR

Polymer Additives Surface Blooming – AFM-IR Paper

Diagnosing Surface Blooming of Polymer Additives Additives impart improved performance characteristics in polymer systems such as anti-oxidation, lubrication and UV protection. Surface blooming of additives can alter the bulk and surface properties of the material, leading to a range of undesirable outcomes from mechanical failure to cross contamination. For plastics in medical devices, changes of […]

AFM-IR for protein secondary structure

Analysing Nanoscale Protein Secondary Structure on Amyloid Fibril with AFM-IR

AFM-IR can be used to study nanoscale protein secondary structure. This method provides valuable insights into biologically important macromolecules, which are not available using other analytical techniques. Blue Scientific is the exclusive distributor for Anasys AFM-IR instruments in the UK. If you have any questions or would like to see a demonstration, please get in touch:  Contact us on 01223 […]

AFM-IR Webinar

AFM-IR Webinar – 18th June 2015

AFM-IR is a breakthrough technique for simultaneous morphological and chemical characterisation at the nanoscale. It offers over 100x improvement in spatial resolution, compared to traditional FT-IR and Raman microscopy. A 1 hour webinar entitled “Nanoscale IR Spectroscopy for Polymers and Life Sciences” will be hosted by our partners Anasys Instruments on Thursday 18th June at 3pm BST. […]