Nordic AFM User Meeting: 25th April 2024
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
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New Bruker BioAFM Contact Resonance Module for Stiff Biological Samples
Bruker’s Contact Resonance module is for mechanical characterisation of stiff biological samples, polymers and metals with AFM (Atomic Force Microscopy). Until now it was not possible to study the nanomechanical properties of samples such as teeth, bones, seeds, wood and medical implants with this level of accuracy.
Bruker Ringing Mode for Surface Adhesion Property Mapping with AFM
Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.
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Single Cell Experiments with the Cytosurge FluidFM and Bruker JPK BioAFM
The Cytosurge FluidFM is now available fully integrated into Bruker JPK BioAFMs. This enables single cell experiments, including adhesion measurement, injection, nano-printing and more.
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NEW Bruker Dimension-XR Scanning Probe Microscopes
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
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High Resolution KPFM with Bruker PeakForce KPFM
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
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Nanoscale Electrical and Mechanical Property Mapping with AFM
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
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Nordic SPM Conference & User Meeting 2018: 10-11 October 2018
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
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In Situ SPM for Nanomechanical and Nanotribological Characterisation
Nanomechanical testing with in situ SPM imaging, using the same probe to ensure test positioning accuracy and correlated results.
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Official Distributor for Renishaw Raman – SPM / AFM in Norway, Denmark, Sweden and Finland
Combined Raman-SPM / AFM instruments are now available in the Nordic region (Sweden, Finland, Norway and Denmark) with our new partnership with Renishaw.
Events
Scanning Probe Microscopy Meeting 2016
Visit us at the Scanning Probe Microscopy Meeting 2016 on 6-7 July 2016 at the University of Warwick.
Events
AFM Workshop: Latest Developments in SPM, 17/03/16, Denmark
Come to our AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark.
