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Category Archive for ‘electron microscopy’

Aerospace engineering

Coating Failure Analysis with SEM-EDS for Aerospace Materials Development

A case study of how SEM-EDS was used for failure analysis of thermal barrier coating in a turbojet engine, for materials development in aerospace engineering.

Cryo-EM with the Gatan BioContinuum HD

New Gatan BioContinuum HD Imaging Filter

Gatan’s best-in-class BioContinuum imaging filter for cryo-EM is now available with EELS and EFTEM.

Gatan Latitude D

New Gatan Latitude D Software for MicroED

New Latitude D software for microED data collection on your TEM.

Crystal Orientation in Geology

Studying Crystal Orientation in Geology with Cathodoluminescence Polarisation-Filtered Spectrum Imaging

Cathodoluminescence can be used to study crystal structure orientation – in this example we look at how it can be used on a geological sample.

Thermo Phenom Pharos G2

New Thermo Scientific Phenom Pharos G2 Desktop FEG-SEM

The Thermo Scientific Phenom Pharos G2 is a desktop FEG-SEM (Field Emission Gun – Scanning Electron Microscope) with upgraded features and low kV imaging.

SEM in Battery Development

Analysing Graphite with SEM in Lithium Ion Battery Development

How desktop SEM can used in-house in lithium ion battery development to analyse graphite and battery materials.

Integrated SEM-EDS for Failure Analysis

Failure Analysis with Integrated SEM-EDS

Integrating SEM and EDS in one system makes it much quicker and easier to identify the root cause of failures. It’s up to twice as fast as conventional techniques, for a lower cost-per-sample and long-term savings.

NEW: Thermo Scientific Phenom Desktop SEM

BlueScientific is now the official UK distributor of Phenom entry-level SEM instruments from Thermo Scientific in the UK and Ireland. We now offer the most comprehensive entry-level range for industry QC and academic research: the fastest and highest resolution in their class.

Gatan Continuum K3 Stela

Energy-Filtered 4D STEM with the Gatan GIF Continuum K3 (incorporating Stela)

A new fully-integrated system from Gatan and DECTRIS provides low-voltage capabilities for electron counting on EELS, EFTEM and energy-filtered 4D STEM over the entire 30 – 300 kV voltage range.

Observing dynamic processes with in-situ TEM

Observe Dynamic Processes with In-Situ TEM: Atomic-Scale Crystal Nucleation and Growth Dynamics

Capture dynamic processes during in-situ TEM experiments with the Gatan OneView IS camera, at up to 25 fps with 16 MP images. In this example, researchers at the University of Tokyo observed crystal nucleation and growth at atomic scale.