AFM Workshop: Latest Developments in SPM, 17/03/16, Denmark

Come to our AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark. Learn about the latest developments in SPM (Scanning Probe Microscopy), with talks from leading scientists including Professor Mingdong Dong of Aarhus University and Kai Dirscherl of DFM. Bring your own samples to test on the world’s fastest AFM.

Registration has now closed. If you would like more information about AFM please contact us.

 Contact us on +44 (0)1223 422 269 or

AFM Workshop

The workshop will be held at DFM in Lyngby, near Copenhagen in Denmark. The day run from 9:30am – 5:30pm, covering the latest SPM techniques:

  • Fastscanning – How to scan samples of any size at the fastest speeds.
  • PeakForce Tapping – Unprecedented high resolution and simultaneous nanoscale property mapping. Image a new range of samples, previously thought impossible with AFM.
  • Nanochemical identification – Using AFM-RAMAN.
AFM image of calcite in fluid

Atomic resolution image of calcite in fluid, acquired with PeakForce Tapping using the Dimension FastScan.

Practical Sessions – Bring your own samples!

bruker_logoTake the opportunity to try out the techniques discussed, with hands-on, practical sessions. Bring your own samples to test on the Bruker Dimension FastScan AFM. The Dimension FastScan is the world’s fastest AFM, suitable for a wide range of sample types, from soft biological samples to very hard materials. Try it out for yourself, using your own real-world samples, and see the results first-hand!


Hear talks from scanning probe microscopy experts and users, including:

Professor Mingdong Dong, Aarhus UniversityAssociate Prof. Mingdong Dong of Aarhus University will give a presentation about “Quantitative Imaging of Nanomaterials by AFM”. The Bio-SPM group are using SPM to investigate the physical and chemical properties of biomolecules and new materials based on nano objects. The group has also developed SPM techniques to study the mechanical properties of molecules and nano structure self-assembly .

Dr Kai Dirscherl from the Danish National Metrology Institute (DFM) will give a talk about how he is using PeakForce KPFM mode to identify surface-embedded particles. PeakForce KPFM uses PeakForce Tapping, scan algorithms and  unique probes for the highest spatial resolution and most accurate measurements of surface potential.

Dr Samuel Lesko of Bruker Nano will present the latest SPM developments from Bruker.

Dr Tim Batten, Raman applications specialist at Renishaw, will discuss “Simple AFM Raman and TERS” (Tip-Enhanced Raman Spectroscopy), about how SPM can be combined with Raman Spectroscopy to investigate the composition, structure and properties of materials at nanometre scales.


The workshop will be held at the Danish National Metrology Institute (DFM), which is on the Technical University of Denmark (DTU) campus in Kongens Lyngby, north of Copenhagen.

Registration is from 9:30am, with talks starting at 10:00am. Lunch and refreshments will be provided, and the day will finish around 5:30pm.


Registration has now closed. If you are interested in AFM or SPM, please contact us:

 Contact us on +44 (0)1223 422 269 or

 More about atomic force microscopes

Dimension FastScan Videos

Test your own samples on the Dimension FastScan AFM from Bruker – watch these videos to see what it can do:

Ultra High-Resolution Imaging of Bacteriorhodopsin

In the first section, the membrane’s patch dynamics are clearly observable before and after the addition of more protein. In the high resolution section, ultra low amplitude PeakForce Tapping™ is used to examine the molecular scale topographic and mechanical properties of the membrane.

Unattended Imaging of Challenging Samples

This video shows Dimension FastScan and ScanAsyst in action, for unattended high speed imaging of a diverse set of challenging samples.