Nordic AFM User Meeting: 25th April 2024
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
atomic force microscopy
Measuring Adhesion in 2D Materials with AFM
A scientific paper has been published in Advanced Materials about studying adhesion in 2D materials with AFM, using the Bruker MultiMode 8.
News
New SECM (Scanning Electrochemical Microscopy) Option for Bruker JPK BioAFM
A new Scanning Electrochemistry option is available for the Bruker JPK NanoWizard BioAFM series. AFM-based SECM is used for electrochemical mapping at nanoscale resolution.
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New Bruker JPK NanoRacer AFM for Single Molecule Applications
The Bruker JPK NanoRacer is a biological AFM (Atomic Force Microscope) with speeds of up to 50 frames per second for studying dynamic biological processes in real time.
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Bruker’s PeakForce Tapping AFM Mode in >4,000 Publications
Celebrating the 10th anniversary of PeakForce Tapping, the fastest growing AFM mode.
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Single Cell Experiments with the Cytosurge FluidFM and Bruker JPK BioAFM
The Cytosurge FluidFM is now available fully integrated into Bruker JPK BioAFMs. This enables single cell experiments, including adhesion measurement, injection, nano-printing and more.
Events
Nordic AFM Days 2019
Join us for a two day conference in Copenhagen about AFM and nanoscale IR spectroscopy (AFM-IR, s-SNOM and O-PTIR).
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Bruker JPK NanoWizard 4 XP: High Resolution, Large Format Bio-AFM
The Bruker JPK NanoWizard 4 XP is a new, high resolution, large format biological AFM system
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NEW Bruker Dimension-XR Scanning Probe Microscopes
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
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NEW: Viscoelastic AFM Measurements matching Bulk DMA (AFM-nDMA)
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
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High Resolution KPFM with Bruker PeakForce KPFM
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
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Nordic SPM Conference & User Meeting 2018: 10-11 October 2018
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
