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Posts Tagged ‘nanoscale’

Scientific Nanoscale Analysis Podcast

“Solutions for NanoAnalysis” Podcast

A new nanoanalysis podcast from Bruker, with special guests from all areas of nanoscale analysis including micro-XRF, TXRF, nanomechanical testing, TEM/SEM and more.

Observing dynamic processes with in-situ TEM

Observe Dynamic Processes with In-Situ TEM: Atomic-Scale Crystal Nucleation and Growth Dynamics

Capture dynamic processes during in-situ TEM experiments with the Gatan OneView IS camera, at up to 25 fps with 16 MP images. In this example, researchers at the University of Tokyo observed crystal nucleation and growth at atomic scale.

Bruker Ringing Mode AFM

Bruker Ringing Mode for Surface Adhesion Property Mapping with AFM

Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.

Gatan Stela 4D STEM

Gatan Stela Hybrid-Pixel Camera for 4D STEM

The Gatan Stela hybrid-pixel camera is a complete system for 4D STEM (4D Scanning Transmission Electron Microscopy).

DNA metastable bubble formation and closure, taken with the Bruker JPK NanoRacer

New Bruker JPK NanoRacer AFM for Single Molecule Applications

The Bruker JPK NanoRacer is a biological AFM (Atomic Force Microscope) with speeds of up to 50 frames per second for studying dynamic biological processes in real time.

GaN Nanowire Defects

Studying Defect Formation in GaN Structures with AFM

Lund University in Sweden recently published two scientific papers about studying defects in GaN nanowires and structures, using AFM and various complementary techniques.

Nanosclae FTIR and s-SNOM

Advanced 2D Materials Research with Nanoscale FTIR and s-SNOM

A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.

PeakForce Tapping with Bruker AFM Microscopy

Bruker’s PeakForce Tapping AFM Mode in >4,000 Publications

Celebrating the 10th anniversary of PeakForce Tapping, the fastest growing AFM mode.

Battery Characterisation with AFM

Battery Research with AFM

An overview of how Atomic Force Microscopy can be used in battery research.

Bruker Anasys nanoIR3-s Broadband

New Bruker nanoIR3-s Broadband Nanoscale IR and SNOM/AFM Microscopy System

The Bruker nanoIR3-s Broadband is the most advanced s-SNOM based nanoscale FTIR spectroscopy system available, with the broadest spectral range, high resolution nanochemical and nano-optical imaging capabilities.